ITSW 2008
Best Student Paper Award:
Pouria Bastani (UCSB)
Design-for-Test continues
to be a challenge with shrinking time-to-market windows, shrinking
device geometries and increasing transistor densities. International
Test Synthesis Workshop (ITSW) is a premier forum designed to
share and exchange ideas, issues and best practices on the
implementation of Design-for-Test (DFT) features in today's complex
ICs and System-on-a-Chip (SOC) designs.
The Program Committee invites you to present recent research results
at the workshop. Apart from paper sessions, the workshop will include
embedded tutorials, panel discussions, round tables and also a Best
Student Paper award. Details of the workshop can be found by following
the links on the left.
To
stay up-to-date with last-minute announcements regarding the workshop,
you can also subscribe to our mailing
list (you can unsubscribe
any time).
|
Key
Dates |
| Abstract
Submission |
January 16, 2008 |
| Acceptance
Notification |
February 27, 2008 |
| Advance
Registration |
March 14, 2008 |
| Hotel
Reservation |
March 15, 2008 |